Keysight / Agilent / HP 4155B Semiconductor Parameter Analyser Semiconductor Parameter Analyser HP_4155B 4155B TMG Test Equipment
Keysight / Agilent / HP

Keysight / Agilent / HP 4155B Semiconductor Parameter Analyser

Keysight / Agilent / HP logo

Keysight / Agilent / HP 4155B Semiconductor Parameter Analyser

Semiconductor Parameter Analyser

High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1?V to 200 V
Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs
Synchronized stress/measure function, two high-voltage pulse generator units (?40 V)
Time-domain measurement: 60?s?variable intervals, up to 10,001 points
Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
Automation: built-in HP Instrument BASIC, trigger I/O capability

[HP_4155B]
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